Windows of The Arab Institute, Paris, designed as an iris to react to the light.


 

 

 

 

ET5000 - E1/T1, E3/T3 & Multi-Interface Tester

   
 

    • Tests asynchronous, synchronous, DDS,
    T-1, fractional T-1, E-1 and fractional E-1,
    T-3 and E-3 facilities and equipment

    • V.35, RS232, RS422/RS530, X.21, HSSI,
    DDS, T-1, E-1, T-3 and E-3 interfaces

    • Data rates from 50 bps to 50 Mbps

    • Displays G.821 performance measurements

    • Front panel, Windows GUI or terminal
    Command Line Interface control

    • AC or battery power

Product Description

The MULTI-TEST is a sophisticated bit error rate tester in a compact, hand held package. It can test a wide variety of communications facilities and equipment including DDS, T-1, fractional T-1, E-1, fractional E-1, T-3 and E-3 NTUs, multiplexers, CSU/DSUs, T-1 CSUs, DTUs and TIUs. It includes a speaker to listen to voice in a DS0. It is supplied with change-able nickel metal hydride batteries and a built-in charger.

E1 and T1 Testing

In the T-1 and E-1 modes, the Tester displays bit errors, transmit and receive frequency, test seconds, bit error rate and G.821 performance measurements (errored seconds, severely errored seconds, degraded minutes and available and unavailable times). A variety of test patterns can be inserted in all or selected DS0s/timeslots, continuous or non-contiguous, making the Tester ideal for fractional
T-1 or E-1 testing. In the T-1 mode, it also displays RX level in db and volts.

T-3 and E-3 Testing

The Multi-Test can test T-3 and E-3 networks and CSUs. It performs G.821 measurements and displays bit errors, bit error rate, frequency and more.

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>>> pricing and further details

 

Asynchronous and Synchronous Testing

In the async and sync test mode, the Tester generates test data in a choice of patterns and formats. The user can select from twenty-eight async and seventy-eight sync test speeds. The Tester displays bit errors, bit error rate and total test seconds. In the async mode, it displays characters received, character errors and errored seconds. In the sync mode, it also displays TX frequency, RX frequency, CTS delay and G.821 measurements.

DDS Testing

The Multi-Test also includes a DDS analyser. It can operate at speeds from 2400 to 72,000 bps in normal and Secondary Channel modes. It can simulate a CSU/DSU to test networks or a network to test CSU/DSUs.

Easy to use

The Multi-Test can be controlled from the front panel or from a local or remote terminal. It includes a two-line LCD display and nineteen LED indicators that show selected mode, test and operating parameters. Parameters are selected by scrolling through values stored in the tester.

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